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16th European Microscopy Congress in Lyon

On behalf of the French Society of Microscopy SFµ, we would like to warmly welcome you in the charming and cultural city of Lyon for the 16th European Microscopy Congress - EMC2016, from August 28th to September 2nd, 2016, organized under the auspices of the European Microscopy Society (EMS) and the International Federation of Microscopy Societies (IFSM).

Abstract submission and Registration are open!

Site web :

Séminar announcement - 10 July 2015

Gianluigi Botton, Director of the Canadian Center for Electron Microscopy (CCEM) at McMaster University Canada has given a seminar on EELS spectroscopy and advanced TEM and STEM: From Catalysis and Plasmonics: Probing the Structure of Nanoscale Materials with the TEM and EELS (see enclosed PDF announcement).

Date : Friday 10 July, 10:00 am, P.G. De Gennes amphitheater, first floor, Blaise Pascal Building, INSA de Lyon.

Charte d'utilisation des instruments du CLYM au plan sanitaire

Dans l'intérêt collectif du bon fonctionnement de la Fédération, tout utilisateur des instruments du CLYM s'engage à ne pas manipuler de produits pathogènes, explosifs, radioactifs ou toxiques dans les salles des microscopes ; toute préparation d'échantillon (dilution, dépôt, concassage, découpe, collage,...) doit être faite en dehors de ces salles (pour le site INSA, la salle de préparation du sous-sol du bâtiment Blaise Pascal est accessible à cet effet).

Focused Ion Beam Microscopy (FIB / SEM): an analytical tool

CLYM proposes a training course based on the "FIB" tool in Materials Sciences.
This course runs over 5 days for a maximum of 6 students(in order to allow a direct and practical contact with the instrument) aims at the following objectives:
- Acquire the theoretical basis regarding cross-beam FIB/SEM microscopy
- practice of 3D approaches in FIB/SEM (image acquisition and treatment of data, EBSD)
- Tackle the TEM prep