Training on dual-beam scanning electron microscopy (FIB/SEM) from 03/18/2024 to 03/22/2024

We are pleased to announce the renewal of the training course entitled "Dual-beam scanning electron microscopy (FIB/SEM): a multiple instrument", organized with CNRS Formation Entreprises for the year 2024. The course will run from 18/03/2024 to 22/03/2024.
The full program can be found on the CNRS website: https://cnrsformation.cnrs.fr/microscopie-a-balayage-double-faisceau-fib...







