Ly-EtTEM (eTEM TITAN 80-300 kV, FEI)CLYM Instruments

CNRS training FIB / SEM (mars 2018)

A CNRS training on « Double beam scanning microscopy (FIB/SEM) » will take place from the 19th to the 23rd of March 2018 at CLyM. It is a « company CNRS training » open to industrials and academics. It is organized jointly by CLyM and MATEIS laboratory of INSA Lyon.

The presentation brochure of the training is attached to this presentation.

 

FIB Nanostructures

Within the context of a book writing entitled "FIB NANOSTRUCTURES" reporting an exhaustive state of the art of FIB various applications for the creation of nanostructures, an ILM team (CLYM partner) has been solicited for the radaction of a chapter titled  "FIB Design for Nanofluidic Application".  In this context, the authors have demonstrated that the use of the dual beam NVision 40 system present at CLYM gives access to a whole new application domain: the NanoFluidique.

 

Editors: Wang, Zhiming M. (Ed.)

Imaging with Microscopes

During the last European Microscopy Conference EMC2016 held in Lyon, a micrograph exhibition was proposed covering different techniques in microscopy, from Confocal Optical Microscopy to Holography and High Resolution in TEM, through SEM and X-ray Tomography, owing to series of images kindly provided by various authors throughout the world (short presentation in the PDF file below).

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