CNRS training FIB / SEM (mars 2018)

A CNRS training on « Double beam scanning microscopy (FIB/SEM) » will take place from the 19th to the 23rd of March 2018 at CLyM. It is a « company CNRS training » open to industrials and academics. It is organized jointly by CLyM and MATEIS laboratory of INSA Lyon.
The presentation brochure of the training is attached to this presentation.