Training

Training on dual-beam scanning electron microscopy (FIB/SEM) from 03/18/2024 to 03/22/2024

1 year 1 week
CNRS training FIB / SEM (march 2020)

5 years 2 weeks
CNRS training FIB / SEM (mars 2018)

7 years 3 weeks
Focused Ion Beam Microscopy (FIB / SEM): an analytical tool

10 years 4 months