CNRS training FIB / SEM (mars 2018)

A CNRS training on « Double beam scanning microscopy (FIB/SEM) » will take place from the 19th to the 23rd of March 2018 at CLyM. It is a « company CNRS training » open to industrials and academics. It is organized jointly by CLyM and MATEIS laboratory of INSA Lyon.

The presentation brochure of the training is attached to this presentation.

For more informations and registration go on the CNRS training website.