WATEM, ANR project 2020-2023
Consortium Lyon Saint-Etienne de Microscopie (FED 4092)
La Microscopie Electronique au CINEMA !
Ciné-Sciences, saison 6. Amphithéâtre de la Délégation CNRS, 2 av. A. Einstein, Villeurbanne Vendredi 22 Octobre, 13h - 13h30.
Saviez-vous qu'il y avait des Microscopes Electroniques en Transmission dans les films Spiderman I ou Avatar ? A travers des images du grand écran, une introduction à cette technique incontournable de recherches en Physique, Chimie, Biologie, Géologie, Sciences des Matériaux et Sciences du Vivant.
New Scanning Probe Microscope
A new Atomic Force Microscope (AFM) capable to acquire real-time multi-parametrical nanoscale measurements via a specific operating mode called “data cube” will join the CLYM facilities. The ultimate objective of POCOYO project is to develop and share unique knowledge in AFM operando experiments, to correlate multidimensional (mechanical, electrical, magnetic properties and chemical-structure relationships) data cubes to external stimuli.
SEEN 2020: Solutions for Environmental Nanoscopy
On March 11 and 12 2020, CLYM in association with DENSsolutions and MILEXIA will organise SEEN2020, a 2 days workshop to demonstrate Solutions for Environmental Electron Nanoscopy: the Climate and Stream systems from DENSsolutions for TEM.
Invited experts will share their experience in environmental EM:
CNRS training FIB / SEM (march 2020)
A CNRS training on « Double beam scanning microscopy (FIB/SEM) » will take place from the 23rd to the 27th of March 2019 at CLyM. It is a « company CNRS training » open to industrials and academics. It is organized jointly by CLyM and MATEIS laboratory of INSA Lyon.
The presentation brochure of the training is attached to this presentation.
For more informations and registration go on the CNRS training website.
1st Oxford Instruments Innovation Day in Lyon
The CLYM, INL and INSA are hosting the 1st Innovation Day in Lyon, to hear from experts across 4 Oxford Instruments business units and receive exclusive advice on your custom applications.
These days are free but requires registration on the Oxford site at this address : oxford innovation day.
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Recent publications
- Spurious phenomena occurring during current measurement on ultra-thin dielectric layers: From electro-thermal effects to surface damage
- Imaging by atomic force microscopy of the properties difference of the layers covering the facets created during SIMS analysis
- Structural study and ferroelectricity of epitaxial BaTiO3 films on silicon grown by molecular beam epitaxy
- Multilayered YAG-Yb:YAG ceramics: manufacture and laser performance
More...