CNRS training FIB / SEM (march 2020)

A CNRS training on « Double beam scanning microscopy (FIB/SEM) » will take place from the 23rd to the 27th of March 2019 at CLyM. It is a « company CNRS training » open to industrials and academics. It is organized jointly by CLyM and MATEIS laboratory of INSA Lyon.

The presentation brochure of the training is attached to this presentation.

For more informations and registration go on the CNRS training website.