Training on dual-beam scanning electron microscopy (FIB/SEM) from 03/18/2024 to 03/22/2024

We are pleased to announce the renewal of the training course entitled "Dual-beam scanning electron microscopy (FIB/SEM): a multiple instrument", organized with CNRS Formation Entreprises for the year 2024. The course will run from 18/03/2024 to 22/03/2024.

The full program can be found on the CNRS website:

You can reserve a place directly by pre-registering online at

For further information, please contact the CNRS Formation Entreprises team: 01 69 82 44 55 or

We look forward to welcoming you!