Focused Ion Beam Microscopy (FIB / SEM): an analytical tool

CLYM proposes a training course based on the "FIB" tool in Materials Sciences.
This course runs over 5 days for a maximum of 6 students(in order to allow a direct and practical contact with the instrument) aims at the following objectives:
- Acquire the theoretical basis regarding cross-beam FIB/SEM microscopy
- practice of 3D approaches in FIB/SEM (image acquisition and treatment of data, EBSD)
- Tackle the TEM prep
In this context, several features will be discussed: eucentricity, the coincidence point, electron / ion deposition, FIB-3D (nanotomography), ion-induced imaging, 3D-EBSD...

Information and registration on the dedicated CNRS web site