Biblio

Qiang, L., E. Chereau, P. Regreny, G. Avit, A. Trassoudaine, E. Gil, Y. André, J-M. Bluet, D. Albertini, and G. Brémond, "Indepth doping assessment of thick doped GaAs layer by scanning spreading resistance microscopy", Journal of Applied Physics, vol. 136, issue 3, 07/2024.

Wang, L., C. Sartel, S. Hassani, V. Sallet, and G. Brémond, "Resolving ZnO-based coaxial core-multishell heterostructure by electrical scanning probe microscopy", Applied Physics Letters, vol. 113, issue 22, pp. 222103, Feb-11-2020, 2018.

Wang, L., B. Gautier, A. Sabac, and G. Brémond, "Investigation of tip-depletion-induced fail in scanning capacitance microscopy for the determination of carrier type", Ultramicroscopy, vol. 174, pp. 46 - 49, Jan-03-2017.

Wang, L., S. Guillemin, J-M. Chauveau, V. Sallet, F. Jomard, R. Brenier, V. Consonni, and G. Brémond, "Characterization of carrier concentration in ZnO nanowires by scanning capacitance microscopy", physica status solidi (c), vol. 13, issue 7-9, pp. 576 - 580, Jan-07-2016.

Wang, L., V. Sallet, C. Sartel, and G. Brémond, "Cross-section imaging and p-type doping assessment of ZnO/ZnO:Sb core-shell nanowires by scanning capacitance microscopy and scanning spreading resistance microscopy", Applied Physics Letters, vol. 109, issue 9, pp. 092101, May-08-2018, 2016.