Investigation of tip-depletion-induced fail in scanning capacitance microscopy for the determination of carrier type

Par administrateur le sam, 12/28/2019 - 21:29
TitreInvestigation of tip-depletion-induced fail in scanning capacitance microscopy for the determination of carrier type
Type de publicationJournal Article
Year of Publication2017
AuteursWang, L., B. Gautier, A. Sabac, and G. Brémond
JournalUltramicroscopy
Volume174
Pagination46 - 49
Date PublishedJan-03-2017
ISSN03043991
DOI10.1016/j.ultramic.2016.12.016
Short TitleUltramicroscopy
Indéfini