Investigation of tip-depletion-induced fail in scanning capacitance microscopy for the determination of carrier type

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TitleInvestigation of tip-depletion-induced fail in scanning capacitance microscopy for the determination of carrier type
Publication TypeJournal Article
Year of Publication2017
AuthorsWang, L., B. Gautier, A. Sabac, and G. Brémond
JournalUltramicroscopy
Volume174
Pagination46 - 49
Date PublishedJan-03-2017
ISSN03043991
DOI10.1016/j.ultramic.2016.12.016
Short TitleUltramicroscopy
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