Characterization of carrier concentration in ZnO nanowires by scanning capacitance microscopy

TitreCharacterization of carrier concentration in ZnO nanowires by scanning capacitance microscopy
Type de publicationJournal Article
Year of Publication2016
AuteursWang, L., S. Guillemin, J-M. Chauveau, V. Sallet, F. Jomard, R. Brenier, V. Consonni, and G. Brémond
Secondary AuthorsSallet, V.
Journalphysica status solidi (c)
Volume13
Ticket7-9
Pagination576 - 580
Date PublishedJan-07-2016
DOI10.1002/pssc.201510268
Short TitlePhys. Status Solidi C
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