Characterization of carrier concentration in ZnO nanowires by scanning capacitance microscopy

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TitreCharacterization of carrier concentration in ZnO nanowires by scanning capacitance microscopy
Type de publicationJournal Article
Year of Publication2016
AuteursWang, L., S. Guillemin, J-M. Chauveau, V. Sallet, F. Jomard, R. Brenier, V. Consonni, and G. Brémond
Secondary AuthorsSallet, V.
Journalphysica status solidi (c)
Volume13
Ticket7-9
Pagination576 - 580
Date PublishedJan-07-2016
DOI10.1002/pssc.201510268
Short TitlePhys. Status Solidi C
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