Access to residual carrier concentration in ZnO nanowires by calibrated scanning spreading resistance microscopy

Par administrateur le dim, 12/29/2019 - 09:44
TitreAccess to residual carrier concentration in ZnO nanowires by calibrated scanning spreading resistance microscopy
Type de publicationJournal Article
Year of Publication2016
AuteursWang, L., J. M. Chauveau, R. Brenier, V. Sallet, F. Jomard, C. Sartel, and G. Brémond
JournalApplied Physics Letters
Volume108
Ticket13
Pagination132103
Date PublishedApr-03-2018
ISSN0003-6951
DOI10.1063/1.4945100
Short TitleAppl. Phys. Lett.
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