Access to residual carrier concentration in ZnO nanowires by calibrated scanning spreading resistance microscopy

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TitleAccess to residual carrier concentration in ZnO nanowires by calibrated scanning spreading resistance microscopy
Publication TypeJournal Article
Year of Publication2016
AuthorsWang, L., J. M. Chauveau, R. Brenier, V. Sallet, F. Jomard, C. Sartel, and G. Brémond
JournalApplied Physics Letters
Volume108
Issue13
Pagination132103
Date PublishedApr-03-2018
ISSN0003-6951
DOI10.1063/1.4945100
Short TitleAppl. Phys. Lett.
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