Consortium Lyon Saint-Etienne de Microscopie (FED 4092)
Investigation of the in-plane and out-of-plane electrical properties of metallic nanoparticles in dielectric matrix thin films elaborated by atomic layer deposition
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| Title | Investigation of the in-plane and out-of-plane electrical properties of metallic nanoparticles in dielectric matrix thin films elaborated by atomic layer deposition |
| Publication Type | Journal Article |
| Year of Publication | 2017 |
| Authors | Thomas, D., E. Puyoo, M. Le Berre, L. Militaru, S. Koneti, A. Malchère, T. Epicier, L. Roiban, D. Albertini, A. Sabac, and F. Calmon |
| Journal | Nanotechnology |
| Volume | 28 |
| Issue | 45 |
| Pagination | 455602 |
| Date Published | Oct-11-2017 |
| ISSN | 0957-4484 |
| DOI | 10.1088/1361-6528/aa8b5e |
| Short Title | Nanotechnology |
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