Biblio

Found 2 results

Filters: Author is Hoummada, K. [Clear All Filters]

2018

Mangelinck, D., E. M. Kousseifi, K. Hoummada, F. Panciera, and T. Epicier, "Lateral growth of NiSi at the θ-Ni2Si/Si(100) interface: Experiments and modelling", Microelectronic Engineering, vol. 199, pp. 45 - 51, Jan-11-2018.

2015

M. Kousseifi, E., K. Hoummada, T. Epicier, and D. Mangelinck, "Direct observation of NiSi lateral growth at the epitaxial θ-Ni2Si/Si(1 0 0) interface", Acta Materialia, vol. 99, pp. 1 - 6, Jan-10-2015.