Nicholas Blanchard (ILM)
This "workhorse" TEM is ideally suited for conventional transmission electron microscopy. E.g. Studying extended defects/dislocations, size and shape of nano-objects (nanoparticles, nanotubes and nanowires) and electron diffraction.
The JEOL 2100 is equipped with a high tilt pole piece with a point-to-point resolution of 0.25 nm at 200 kV. The minimum probe size is ~1 nm. The microscope is equipped with a STEM module and both a bright field and annular dark field detector.
The microscope is aligned at 80, 120 & 200 kV and is equipped with a bottom mount Orius SC1000 CCD camera (Gatan)
EDX XMAX 80mm² & Aztec software (OXFORD INSTRUMENTS)
JEOL single tilt holder (X-tilt: +/-42°), JEOL analytical Be double-tilt holder (X-tilt: +/-42°, Y-tilt)
|Bright field TEM image of a SiC nanowire|
|Bright field TEM image of bipyramid Au nanoparticles|
|Two beam (g = 002) dark field TEM image of a MBE grown layered structure: InP/AlAs/InAlAs/ InGaAs|
|Bright field TEM image of thin foil prepared by FIB|
|Two beam (g = 1-10) dark field TEM image of twin defects in a single grain in a boron carbide ceramic|