TEM JEOL 2010F

Microscope team

Lucian Roiban (Mateis, INSA de Lyon), Clémentine Fellah (LGL-TPE), Annie Malchère (MATEIS).

 

Presentation of the microscope

The JEOL 2010F microscope, installed in CLYM, is a field-emission transmission electron microscope, with a resolution of 0.195 nm and a minimum probe size of 0.3 nm (0.5 nm, standard conditions). This TEM operates at 200kV and uses a Schottky field emitter. These characteristics make it a high-resolution and high-performance instrument for the characterization of a wide range of samples. A STEM device allows the acquisition of images in High Angle Annular Dark Field (HAADF).

 

Microscope features

The JEOL 2010F microscope is equipped with several analytical systems:

  • An EDX X MAX 80 system (OXFORD INSTRUMENTS),
  • A DigiPEELS system (GATAN) with an optimal energy resolution of 0.65 eV (1-1.2 eV, standard conditions).

JEOL single-tilt and double-tilt sample holders are available as well as a tip for single-tilt tomography (+/- 85°).

 

Photograph library

High-resolution instrument

Nanoporous silicon powder (NP-Si)

TEM (left) and HRTEM (right) images with FT calculated inside the blue square.

doi : 10.1016/j.matchar.2016.12.013

 

TEM (a.) and HRTEM (b.) images with FT of ZnO-PAA nano-hybride with 0.1% Mn

doi : 10.1038/s41598-019-48497-3

 

STEM

Yttrium oxide doped Si3N4 polycrystal : grain boundary  and detail of the resolution of the HAADF silicon subnetwork.

 

STEM HAADF observation of a Ag :TiO2 film

doi : 10.1007/s11998-018-0105-0

 

EDX XMAX 80 system

STEM-HAADF observation of three populations of precipitates (a : (Ti,Nb)C, b : Ti4C2S2, c : TiN) found in steel with associated EDX spectra.

doi : 10.1016/j.mtla.2019.100233

 

DigiPEELS system

HRTEM image of nitride replicas on carbon film (left) and associated electron energy loss spectroscopy spectrum (EELS) that indicates iron in these chromium-rich nitrides (right)

doi : 10.3390/ma11081409