NVision 40

FIB/SEM workstation: Association of a focused ion beam (FIB), a gas injection system, analytical tools and nano-manipulators to a scanning electron microscope (SEM)

FIB/SEM Microscopy-Team

Thierry Douillard (MATEIS), Nicholas Blanchard (ILM), Rémy Fulcrand (ILM), Cyril Langlois (MATEIS), Florent Dalmas (MATEIS), Solène Brottet (INL).