TEM JEOL NEO-ARM
Microscope team
Stéphanie Reynaud (Laboratoire Hubert Curien), Anne-Magali Seydoux-Guillaume (LGL), Mimoun Aouine (IRCELYON), Matthieu Bugnet (MATEIS), Yaya Lefkir (Laboratoire Hubert Curien)
Presentation of the microscope
The JEM-ARM200F Cold FEG NeoARM is a transmission electron microscope fitted with a cold-field emission gun and a last generation spherical aberration corrector of the condensor lenses. It is equipped with high-end analytical tools, such as a wide angle EDX spectrometer, and an electron energy-loss spectrometer for STEM-EELS and filtered imaging capabilities. This instrument is optimized for structural and chemical analysis at sub-nm (atomic) resolution. It was installed in March 2019, within the Hubert Curien Laboratory, UMR CNRS 5513, in Saint-Etienne (campus Manufacture).
Microscope features
- High brightness cold-field emission gun (C-FEG, ~0.3eV energy spread)
- TEM/STEM alignments @ 60, 80 and 200 kVTEM imaging ; point resolutio
- n 1.9 Å, line resolution 1.0 Å @ 200 kV
- STEM resolution : 0.78 Å @ 200 kV
- Single-tilt and double-tilt (Be) reinforced sample holders + tomography add-on
- Cs corrector CEOS ASCOR
- STEM detectors : JEOL ADF, BF – GATAN ADF, BF/DF
- Cameras : CMOS Gatan Rio 4k*4k + CCD GATAN ULTRASCAN 2k*2k Modèle 994 in the GIF
- EDX Chemical analysis : Jeol EDX SDD CENTURIO-X (resolution 129 eV)
- EELS : Gatan GIF Quantum ER (resolution 0.1 eV)
Photograph library
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