Spurious phenomena occurring during current measurement on ultra-thin dielectric layers: From electro-thermal effects to surface damage

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TitleSpurious phenomena occurring during current measurement on ultra-thin dielectric layers: From electro-thermal effects to surface damage
Publication TypeJournal Article
Year of Publication2014
AuthorsGrandfond, A., B. Gautier, L. Militaru, D. Albertini, and A. Descamps-Mandine
JournalJournal of Applied Physics
Volume115
Issue13
Pagination134103
Date PublishedJul-04-2014
ISSN0021-8979
DOI10.1063/1.4869182
Short TitleJournal of Applied Physics
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