Consortium Lyon Saint-Etienne de Microscopie (FED 4092)
Imaging by atomic force microscopy of the properties difference of the layers covering the facets created during SIMS analysis
By administrateur on Sun, 12/29/2019 - 10:55
| Title | Imaging by atomic force microscopy of the properties difference of the layers covering the facets created during SIMS analysis |
| Publication Type | Journal Article |
| Year of Publication | 2014 |
| Authors | Fares, B., B. Gautier, D. Albertini, A. Mzerd, and M. Loghmarti |
| Journal | Applied Surface Science |
| Volume | 308 |
| Pagination | 24 - 30 |
| Date Published | Jan-07-2014 |
| ISSN | 01694332 |
| DOI | 10.1016/j.apsusc.2014.04.054 |
| Short Title | Applied Surface Science |
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