Carrier trapping study on a Ge nanocrystal by two-pass lift mode electrostatic force microscopy

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TitleCarrier trapping study on a Ge nanocrystal by two-pass lift mode electrostatic force microscopy
Publication TypeJournal Article
Year of Publication2015
AuthorsLin, Z., P. Brunkov, F. Bassani, A. Descamps, C. O’Dwyer, and G. Bremond
JournalMaterials Research Express
Volume2
Issue3
Pagination035001
Date PublishedJan-03-2015
DOI10.1088/2053-1591/2/3/035001
Short TitleMater. Res. Express
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