Biblio

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Filters: Author is Philippon, David [Clear All Filters]

2023

Sayilan, A., N. Mary, D. Philippon, P. Steyer, and S. Descartes, "Tribological analysis of TiN film during run-in period: An in situ investigation under controlled environment in eSEM", Surface and Coatings Technology, vol. 455, pp. 129228, 01/2023.