Biblio

Qiang, L., E. Chereau, P. Regreny, G. Avit, A. Trassoudaine, E. Gil, Y. André, J-M. Bluet, D. Albertini, and G. Brémond, "Indepth doping assessment of thick doped GaAs layer by scanning spreading resistance microscopy", Journal of Applied Physics, vol. 136, issue 3, 07/2024.