Carrier trapping study on a Ge nanocrystal by two-pass lift mode electrostatic force microscopy

Par administrateur le dim, 12/29/2019 - 09:56
TitreCarrier trapping study on a Ge nanocrystal by two-pass lift mode electrostatic force microscopy
Type de publicationJournal Article
Year of Publication2015
AuteursLin, Z., P. Brunkov, F. Bassani, A. Descamps, C. O’Dwyer, and G. Bremond
JournalMaterials Research Express
Volume2
Ticket3
Pagination035001
Date PublishedJan-03-2015
DOI10.1088/2053-1591/2/3/035001
Short TitleMater. Res. Express
Indéfini