Consortium Lyon Saint-Etienne de Microscopie (FED 4092)
Investigation of the in-plane and out-of-plane electrical properties of metallic nanoparticles in dielectric matrix thin films elaborated by atomic layer deposition
Par administrateur le sam, 12/28/2019 - 21:28
| Titre | Investigation of the in-plane and out-of-plane electrical properties of metallic nanoparticles in dielectric matrix thin films elaborated by atomic layer deposition |
| Type de publication | Journal Article |
| Year of Publication | 2017 |
| Auteurs | Thomas, D., E. Puyoo, M. Le Berre, L. Militaru, S. Koneti, A. Malchère, T. Epicier, L. Roiban, D. Albertini, A. Sabac, and F. Calmon |
| Journal | Nanotechnology |
| Volume | 28 |
| Ticket | 45 |
| Pagination | 455602 |
| Date Published | Oct-11-2017 |
| ISSN | 0957-4484 |
| DOI | 10.1088/1361-6528/aa8b5e |
| Short Title | Nanotechnology |
Indéfini