Characterization of precipitates size distribution: validation of low-voltage STEM

TitreCharacterization of precipitates size distribution: validation of low-voltage STEM
Type de publicationJournal Article
Year of Publication2008
AuteursACEVEDO-REYES, D., M. PEREZ, C. VERDU, A. Bogner, and T. Epicier
JournalJournal of Microscopy
Volume232
Ticket1
Pagination112 - 122
Date Published01/2008
ISSN00222720
URLhttp://blackwell-synergy.com/doi/abs/10.1111/jmi.2008.232.issue-1http://doi.wiley.com/10.1111/j.1365-2818.2008.02082.x
DOI10.1111/jmi.2008.232.issue-110.1111/j.1365-2818.2008.02082.x
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