Biblio

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Filtres: Auteur is Thollet, G and Mot-clé is Microscopy, Electron, Scanning [Clear All Filters]

2007

Bogner, A., P-H. Jouneau, G. Thollet, D. Basset, and C. Gauthier, "A history of scanning electron microscopy developments: towards "wet-STEM" imaging.", Micron, vol. 38, issue 4, pp. 390-401, 2007.