Koneti, S., L. Roiban, F. Dalmas, C. Langlois, A-S. Gay, A. Cabiac, T. Grenier, H. Banjak, V. Maxim, and T. Epicier,
"Fast electron tomography: Applications to beam sensitive samples and in situ TEM or operando environmental TEM studies",
Materials Characterization, vol. 151, pp. 480 - 495, Jan-05-2019.