Guillaume, N., E. Puyoo, M. Le Berre, D. Albertini, N. Baboux, C. Chevalier, K. Ayadi, J. Grégoire, B. Gautier, and F. Calmon,
"Study and characterization of the irreversible transformation of electrically stressed planar Ti/TiO x /Ti junctions",
Journal of Applied Physics, vol. 118, issue 14, pp. 144502, Feb-10-2016, 2015.