Biblio

Gomès, S., L. David, V. Lysenko, A. Descamps, T. Nychyporuk, and M. Raynaud, "Application of scanning thermal microscopy for thermal conductivity measurements on meso-porous silicon thin films", Journal of Physics D: Applied Physics, vol. 40, issue 21, pp. 6677 - 6683, 11/2007.