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2016

Wang, L., S. Guillemin, J-M. Chauveau, V. Sallet, F. Jomard, R. Brenier, V. Consonni, and G. Brémond, "Characterization of carrier concentration in ZnO nanowires by scanning capacitance microscopy", physica status solidi (c), vol. 13, issue 7-9, pp. 576 - 580, Jan-07-2016.