Biblio

Wang, L., J. M. Chauveau, R. Brenier, V. Sallet, F. Jomard, C. Sartel, and G. Brémond, "Access to residual carrier concentration in ZnO nanowires by calibrated scanning spreading resistance microscopy", Applied Physics Letters, vol. 108, issue 13, pp. 132103, Apr-03-2018, 2016.

Wang, L., J. Laurent, J. M. Chauveau, V. Sallet, F. Jomard, and G. Brémond, "Nanoscale calibration of n-type ZnO staircase structures by scanning capacitance microscopy", Applied Physics Letters, vol. 107, issue 19, pp. 192101, Sep-11-2015.